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Normas BSI – AENOR
BS EN 61000-4-29:2001, IEC 61000-4-29:2000

BS EN 61000-4-29:2001, IEC 61000-4-29:2000

Electromagnetic compatibility (EMC). Testing and measurement techniques. Testing and measurement techniques. Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests. Voltage dips, short interruptions and voltage variations on d.c.input power ports. Immunity tests. Basic EMC Publication.

Fecha:
2001-07-15 /Under Review
Comité:
GEL/210/11
Equivalencias internacionales:

EN 61000-4-29:2000

IEC 60738-1:2006

IEC 61000-4-29:2000

Resumen:
Establishes a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure.
Keywords:
Electromagnetic fields, Electronic equipment and components, Test equipment, Electromagnetic radiation, Interruption tests, Low-voltage equipment, Electric power system disturbances, Electromagnetic tests, Electrical equipment, Electrical measurement, Testing conditions, Electromagnetic compatibility, Voltage fluctuations, Electrical testing, Low voltage, Direct current
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