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Normas BSI – AENOR
DD 174:1988

DD 174:1988

Guide to the calibration and setting up of the ultrasonic time of flight diffraction (TOFD) technique for the location and sizing of flaws

Fecha Anulación:
1993-12-15 /Withdrawn
Comité:
WEE/46
Relación con otras normas BSI:

Reemplazada por: BS 7706:1993

Keywords:
Size measurement, Calibration, Depth, Scanners, Test equipment, Errors, Diffraction, Error analysis, Accuracy, Non-destructive testing, Flaws, Flaw detection, Equations, Ultrasonic testing, Test specimens, Transducers, Classification systems
143,3
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