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Normas BSI – AENOR
BS 9450:1998

BS 9450:1998

Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test

Fecha Anulación:
2013-08-02 /Withdrawn
Comité:
EPL/47
Relación con otras normas BSI:

Reemplazada por: BS IEC 60748-11:2000

Reemplazada por: BS IEC 60747-10:1991

Reemplaza a: BS 9450:1975

Keywords:
Quality assurance systems, Colour codes, Microassembling, Visual inspection (testing), Testing conditions, Damp-heat tests, Defects, Test equipment, Peeling tests, Handbooks, Specification (approval), Layout, Vibration testing, Fire tests, Capability approval, Assessed quality, Inspection, Statistical quality control, Electronic equipment and components, Capacitors, Solderability testing, Ratings, Sampling methods, Monolithic integrated circuits, Thick-film circuits, Electrical measurement, Acceleration tests, Radioactive tracer methods, Solvent-resistance tests, Safety measures, Approval testing, Thin-film circuits, Adhesion tests, Flow charts, Conformity, Electric conductors, Technical writing, Shear testing, Circuits, Environmental testing, Transistors, Leak tests, Resistors, Endurance testing, Detail specification, Thermal-cycling tests, Impact testing, Thick-film devices, Data, Flammability, Tracer methods, Repair, Electrical testing, Technical documents, Quality control, Marking, Mechanical testing, Accelerated testing, Integrated circuits
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