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Normas BSI – AENOR
BS EN 100012:1996

BS EN 100012:1996

Harmonized system of quality assessment for electronic components. Basic specification. X-ray inspection of electronic components

Fecha:
1996-04-15 /Definitive
Comité:
EPL/40X
Equivalencias internacionales:

EN 100012:1995

Relación con otras normas BSI:

Reemplaza a: BS CECC 00012:1985

Keywords:
Visual inspection (testing), Examination (quality assurance), Inspection, Test equipment, Assessed quality, X-ray analysis, Quality assurance systems, X-ray apparatus, Non-destructive testing, Testing conditions, Specification (approval), Electronic equipment and components, Approval testing, Radiographic testing
129,17
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Formato digital

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