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Normas BSI – AENOR
BS CECC 90000:Addendum No. 1:1983

BS CECC 90000:Addendum No. 1:1983

Harmonized system of quality assessment for electronic components. Generic specification: monolithic integrated circuits. Internal visual inspection

Fecha:
1983-07-29 /Definitive
Comité:
EPL/47
Equivalencias internacionales:

CECC 90000

Keywords:
Defects, Particle size distribution, Assessed quality, Specification (approval), Passivation, Microscopic analysis, Circuits, Quality control, Approval testing, Metallizing, Monolithic integrated circuits, Surface defects, Qualification approval, Integrated circuits, Visual inspection (testing), Inspection, Quality assurance systems, Testing conditions, Electronic equipment and components
285,84
Idioma Formato

Formato digital

Nota: Precios sin IVA ni gastos de envío

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