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Normas BSI – AENOR
BS 5411-8:1991, ISO 3497:1990

BS 5411-8:1991, ISO 3497:1990

Methods of test for metallic and related coatings. Measurement of coating thickness of metallic coatings: X-ray spectrometric methods

Fecha Anulación:
2001-03-15 /Withdrawn
Comité:
STI/33
Equivalencias internacionales:

ISO 3497:1990

Relación con otras normas BSI:

Reemplazada por: BS EN ISO 3497:2001

Keywords:
X-ray analysis, Coatings, Instrumental methods of analysis, Thickness measurement, Spectroscopy, X-ray fluorescence spectrometry, Metal coatings, Fluorimetry, Calibration
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