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Normas BSI – AENOR
BS CECC 90112:1987

BS CECC 90112:1987

Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits

Fecha:
1987-08-15 /Under Review
Comité:
EPL/47
Equivalencias internacionales:

CECC 90112:1986

Keywords:
Circuits, Integrated circuits, Digital circuits, Quality assurance systems, Electronic equipment and components, Computer storage devices, Inspection, Statistical quality control, Approval testing, Assessed quality, Electronic storage, Digital integrated circuits, Semiconductor storage, Integrated memory circuits, Specification (approval), Semiconductor devices, Qualification approval, Quality control, Silicon, Detail specification, Metal oxide semiconductors, Direct-access storage, Testing conditions, Monolithic integrated circuits
155,46
Idioma Formato

Formato digital

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