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Normas BSI – AENOR
BS EN 60115-8:2012

BS EN 60115-8:2012

Fixed resistors for use in electronic equipment. Sectional specification. Fixed surface mount resistors

Fecha:
2012-12-31 /Definitive
Comité:
EPL/40X
Equivalencias internacionales:

EN 60115-8:2012

IEC 60115-8:2009

Relación con otras normas BSI:

Reemplaza a: BS EN 140400:2003

Reemplaza a: BS QC 400600:1990

Resumen:
IEC 60115-8:2009 is applicable to fixed surface mount resistors for use in electronic equipment. These resistors are typically described according to types (different geometric shapes) and styles (different dimensions). They have metallized terminations and are primarily intended to be mounted directly on to a circuit board. The major technical changes with regard to the first edition are the following:
- introduction of a product classification based on application requirements;
- extension of the list of styles and dimensions;
- use of an extended scope of stability class definitions;
- extension of the lists of preferred values of ratings;
- inclusion of test conditions and requirements for lead-free soldering, for periodic overload and for resistance to electrostatic discharge (ESD);
- inclusion of a new set of severities for a shear test;
- inclusion of definitions for a test board;
- replacement of assessment level E and possible others by the sole assessment level EZ, meeting the requirements of a "zero defect" approach;
- inclusion of an extended endurance test, a flammability test, a temperature rise test, vibration tests, an extended rapid change of temperature test, and a single pulse high-voltage overload test;
- inclusion of requirements applicable to 0 ohm resistors (jumpers).
Keywords:
Resistors, Dimensions, Fixed resistors, Electrical components, Temperature coefficient of resistance, Approval testing, Assessed quality, Specification (approval), Environment (working), Inspection, Statistical quality control, Electronic equipment and components, Ratings, Quality assurance systems, Qualification approval, Performance, Quality control, Sampling methods
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